Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China

Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China

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Bibliographic Details
Corporate Authors: Asian Test Symposium, IEEE Computer Society
Format: Unknown
Published: Los Alamitos, Calif. IEEE Computer Society Press 1993
Subjects:
Electronic digital computers > Circuits > Testing > Congresses
Electrnic circuits > Testing > Congresses
Fault-tolerant computing > Congresses
Online Access:Click Here to View Status and Holdings.
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