Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China

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Bibliographic Details
Corporate Authors:	Asian Test Symposium, IEEE Computer Society
Format:	Book
Published:	Los Alamitos, Calif. IEEE Computer Society Press 1993
Subjects:	Electronic digital computers > Circuits > Testing > Congresses Electrnic circuits > Testing > Congresses Fault-tolerant computing > Congresses
Online Access:	Click Here to View Status and Holdings.
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