Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China

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Bibliographic Details
Corporate Authors:	Asian Test Symposium, IEEE Computer Society
Format:	Unknown
Published:	Los Alamitos, Calif. IEEE Computer Society Press 1993
Subjects:	Electronic digital computers > Circuits > Testing > Congresses Electrnic circuits > Testing > Congresses Fault-tolerant computing > Congresses
Online Access:	Click Here to View Status and Holdings.
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MARC


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090	0	0	\|a TK7888.4 \|b .A85 1993
110	1	#	\|a Asian Test Symposium \|i 2nd \|j Peking, China \|k 1993
245	1	1	\|a Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China \|c sponsored by the IEEE Computer Society Test Technology Technical Committee in cooperation with China Computer Federation (CCF) ... [et al.]
260	#	#	\|a Los Alamitos, Calif. \|b IEEE Computer Society Press \|c 1993
300	#	#	\|a xii, 341 p. \|b ill. \|c 28 cm
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Electronic digital computers \|x Circuits \|x Testing \|x Congresses
650	#	0	\|a Electrnic circuits \|x Testing \|x Congresses
650	#	0	\|a Fault-tolerant computing \|x Congresses
710	1	#	\|a IEEE Computer Society \|c Test Technology Technical Committee
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=88050
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