Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China

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Bibliographic Details
Corporate Authors: Asian Test Symposium, IEEE Computer Society
Format: Book
Published: Los Alamitos, Calif. IEEE Computer Society Press 1993
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Online Access:Click Here to View Status and Holdings.
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090 0 0 |a TK7888.4  |b .A85 1993 
110 1 # |a Asian Test Symposium  |i 2nd  |j Peking, China  |k 1993 
245 1 1 |a Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China  |c sponsored by the IEEE Computer Society Test Technology Technical Committee in cooperation with China Computer Federation (CCF) ... [et al.] 
260 # # |a Los Alamitos, Calif.  |b IEEE Computer Society Press  |c 1993 
300 # # |a xii, 341 p.  |b ill.  |c 28 cm 
504 # # |a Includes bibliographical references and index 
650 # 0 |a Electronic digital computers  |x Circuits  |x Testing  |x Congresses 
650 # 0 |a Electrnic circuits  |x Testing  |x Congresses 
650 # 0 |a Fault-tolerant computing  |x Congresses 
710 1 # |a IEEE Computer Society  |c Test Technology Technical Committee 
856 4 0 |z Click Here to View Status and Holdings.  |u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=88050 
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