The test access port and boundary-scan architecture

The test access port and boundary-scan architecture

Saved in:
Bibliographic Details
Other Authors: Maunder, Colin M, Tulloss, Rodham E
Format: Book
Published: Los Alamitos, Calif. IEEE Computer Society Press 1990
Series:IEEE Computer Society Press tutorial
Subjects:
Boundary scan testing
Electronic circuits > Testing > Data processing
Computer architecture
Online Access:Click Here to View Status and Holdings.
Tags: Add Tag
No Tags, Be the first to tag this record!
Be the first to leave a comment!
You must be logged in first

Similar Items