The test access port and boundary-scan architecture

The test access port and boundary-scan architecture

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Bibliographic Details
Other Authors: Maunder, Colin M, Tulloss, Rodham E
Format: Unknown
Published: Los Alamitos, Calif. IEEE Computer Society Press 1990
Series:IEEE Computer Society Press tutorial
Subjects:
Boundary scan testing
Electronic circuits > Testing > Data processing
Computer architecture
Online Access:Click Here to View Status and Holdings.
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