The test access port and boundary-scan architecture

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Bibliographic Details
Other Authors:	Maunder, Colin M, Tulloss, Rodham E
Format:	Book
Published:	Los Alamitos, Calif. IEEE Computer Society Press 1990
Series:	IEEE Computer Society Press tutorial
Subjects:	Boundary scan testing Electronic circuits > Testing > Data processing Computer architecture
Online Access:	Click Here to View Status and Holdings.
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MARC


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001	wils-87116
020	#	#	\|a 0818690704
090	0	0	\|a TK7867 \|b .T39 1990
245	1	1	\|a The test access port and boundary-scan architecture \|c [edited by] Colin M. Maunder, Rodham E. Tulloss
260	#	#	\|a Los Alamitos, Calif. \|b IEEE Computer Society Press \|c 1990
300	#	#	\|a xxii, 372 p. \|b ill. \|c 29 cm
490	1	#	\|a IEEE Computer Society Press tutorial
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Boundary scan testing
650	#	0	\|a Electronic circuits \|x Testing \|x Data processing
650	#	0	\|a Computer architecture
700	1	#	\|a Maunder, Colin M
700	#	#	\|a Tulloss, Rodham E
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=87116
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam
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