VLSI testing

VLSI testing

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Bibliographic Details
Other Authors: Williams, T. W. 1943-
Format: Book
Language:English
Published: Amsterdam New York New York, N.Y., U.S.A. North-Holland Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co. 1988
Series:Advances in CAD for VLSI v. 5
Subjects:
Integrated circuits > Very large scale integration > Testing
Online Access:Click Here to View Status and Holdings.
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