VLSI testing
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| Other Authors: | |
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| Format: | Book |
| Language: | English |
| Published: |
Amsterdam New York New York, N.Y., U.S.A.
North-Holland Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co.
1988
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| Series: | Advances in CAD for VLSI
v. 5 |
| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
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Add Tag | Physical Description: | ix, 275 p. ill. 25 cm |
|---|---|
| Bibliography: | Includes bibliographies. |
| ISBN: | 0444878955 |
Introduction to VLSI testing