Proceedings of the 1994 Second CAD-Based Vision workshop, February 8-11, 1994, Champion, Pennsylvania

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Bibliographic Details
Corporate Authors: CAD-Based Vision workshop, IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence
Other Authors: Kak, Avinash C., Ikeuchi, Katsushi
Format: Unknown
Published: Los Alamitos, Calif. IEEE Computer Society Press 1994
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Description
Item Description:IEEE Catalog Number 94TH0595-9
Physical Description:ix, 307 p. ill. 29 cm
Bibliography:Includes bibliographical references and author index
ISBN:0818653108