Fault covering problems in reconfigurable VLSI systems

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Bibliographic Details
Other Authors:	Libeskind-Hadas, Ran
Format:	Book
Published:	Boston Kluwer 1992
Series:	The Kluwer international series in engineering and computer science VLSI, computer architecture, and digital signal processing SECS 172.
Subjects:	Integrated circuits > Very large scale integration > Design and construction > Data processing Integrated circuits > Wafer-scale integration > Design and construction > Data processing Fault-tolerant computing
Online Access:	Click Here to View Status and Holdings.
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020	#	#	\|a 0792392310
090	0	0	\|a TK7874 \|b .F38 1992
245	1	1	\|a Fault covering problems in reconfigurable VLSI systems \|c by Ran Libeskind-Hadas ... [et al.]
260	#	#	\|a Boston \|b Kluwer \|c 1992
300	#	#	\|a xiii, 130 p. \|b ill. \|c 25 cm
490	1	#	\|a The Kluwer international series in engineering and computer science \|a VLSI, computer architecture, and digital signal processing \|v SECS 172.
504	#	#	\|a Includes bibliographical references (p. 119-127) and index
650	#	0	\|a Integrated circuits \|x Very large scale integration \|x Design and construction \|x Data processing
650	#	0	\|a Integrated circuits \|x Wafer-scale integration \|x Design and construction \|x Data processing
650	#	0	\|a Fault-tolerant computing
700	1	#	\|a Libeskind-Hadas, Ran
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=74434
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam
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