Self-testing VLSI design

Saved in:

Bibliographic Details
Main Author:	Yarmolik, Viacheslav Nikolaevich
Other Authors:	Kachan, I. V.
Format:	Book
Published:	Amsterdam Elsevier 1993
Subjects:	Integrated circuits > Very large scale integration > Testing
Online Access:	Click Here to View Status and Holdings.
Tags:	Add Tag No Tags, Be the first to tag this record!

MARC


LEADER	00000n a2200000 a 4501
001	wils-74388
020	#	#	\|a 0444896406
090	0	0	\|a TK7874 \|b .Y16 1993
100	1	#	\|a Yarmolik, Viacheslav Nikolaevich
245	1	1	\|a Self-testing VLSI design \|c V. N. Yarmolik, I. V. Kachan
260	#	#	\|a Amsterdam \|b Elsevier \|c 1993
300	#	#	\|a xi, 345 p. \|b ill. \|c 25 cm
504	#	#	\|a Includes bibliographical references (p.329-341) and index
650	#	0	\|a Integrated circuits \|x Very large scale integration \|x Testing
700	1	#	\|a Kachan, I. V. \|y joint author
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=74388
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam
998	#	#	\|a 00260##a002.8.2\|\|00260##b002.8.4\|\|00260##c002.7.6\|\|00300##a003.4.1\|\|00300##b003.6.1\|\|00300##c003.5.1\|\|