VLSI electronics microstructure science VLSI Reliability

VLSI electronics microstructure science

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Bibliographic Details
Main Author: Sabnis, Anant G
Format: Unknown
Published: San Diego Academic Press 1990
Series:VLSI electronics v. 22
Subjects:
Integrated circuits > Very large scale integration > Reliability
Online Access:Click Here to View Status and Holdings.
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Description
Item Description:Cover title:VLSI Reliability
Physical Description:xiii, 207 p. ill. 24 cm
Bibliography:Includes bibliographical references and index
ISBN:0122341228

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