Particle beam microanalysis

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Bibliographic Details
Main Author:	Fuchs, Ekkehard
Other Authors:	Oppolzer, Helmut, Rehme, Hans
Format:	Book
Published:	Weinheim, F.R.G. New York, NY, USA VCH 1990
Edition:	1st ed
Subjects:	Materials > Microscopy Electron microscopy > Industrial applications
Online Access:	Click Here to View Status and Holdings.
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020	#	#	\|a 3527268847
090	0	0	\|a TA417.23 \|b .F83 1990
100	1	#	\|a Fuchs, Ekkehard
245	1	1	\|a Particle beam microanalysis \|c Ekkehard Fuchs, Helmut Oppolzer, Hans Rehme
250	#	#	\|a 1st ed
260	#	#	\|a Weinheim, F.R.G. \|a New York, NY, USA \|b VCH \|c 1990
300	#	#	\|a 507p. \|c 23cm
504	#	#	\|a Includes bibliographical references and index.
650	#	0	\|a Materials \|x Microscopy
650	#	0	\|a Electron microscopy \|x Industrial applications
700	1	#	\|a Oppolzer, Helmut
700	#	#	\|a Rehme, Hans
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=64732
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam
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