ESSENTIALS OF ELECTRONIC TESTING FOR DIGITAL, MEMORY AND MIXED-SIGNAL VLSI CIRCUITS

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Bibliographic Details
Main Authors:	Bushnell, Michael L. 1950- Michael Lee (Author), Agrawal, Vishwani D. (Author)
Format:	Book
Language:	English
Published:	New York Kluwer Academic 2002
Series:	FRONTIERS IN ELECTRONIC TESTING
Subjects:	Digital integrated circuits > Testing Integrated circuits > Very large scale integration > Testing
Online Access:	Click Here to View Status and Holdings.
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