ESSENTIALS OF ELECTRONIC TESTING FOR DIGITAL, MEMORY AND MIXED-SIGNAL VLSI CIRCUITS

ESSENTIALS OF ELECTRONIC TESTING FOR DIGITAL, MEMORY AND MIXED-SIGNAL VLSI CIRCUITS

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Bibliographic Details
Main Authors: Bushnell, Michael L. 1950- Michael Lee (Author), Agrawal, Vishwani D. (Author)
Format: Book
Language:English
Published: New York Kluwer Academic 2002
Series:FRONTIERS IN ELECTRONIC TESTING
Subjects:
Digital integrated circuits > Testing
Integrated circuits > Very large scale integration > Testing
Online Access:Click Here to View Status and Holdings.
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Description
ISBN:9781475781427

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