Reliability and materials issues of III-V and II-VI semiconductor optical and electrical devices and materials II symposium held April 9-13, 2012, San Francisco, California, USA
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| Format: | Book |
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rrendale, Pa
Materials Research Society
2012
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| Series: | Materials Research Society symposia proceedings
v. 143 |
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| Online Access: | Click Here to View Status and Holdings. |
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| 111 | 1 | # | |s ymposium G, "Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials II" |a Symposium G, "Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials II" |c San Francisco, Calif.) |d (2012 |
| 245 | 1 | 0 | |a Reliability and materials issues of III-V and II-VI semiconductor optical and electrical devices and materials II |b symposium held April 9-13, 2012, San Francisco, California, USA |c editors Osamu Ueda ... [et al.] |
| 260 | # | # | |a rrendale, Pa |b Materials Research Society |c 2012 |
| 300 | # | # | |a xiii, 195 p. |b ill. |c 24 cm |i ii, 195 p. |
| 490 | 1 | # | |m aterials Research Society symposium proceedings |a Materials Research Society symposium proceedings |v v. 1432 |
| 504 | # | # | |a Includes bibliographical references and indexes |n cludes bibliographical references and indexes |
| 650 | # | 0 | |m icroelectronics |a Microelectronics |v Congresse |x Reliability |
| 650 | # | 0 | |s emiconductors |a Semiconductors |v Congresse |x Materials |
| 650 | # | 0 | |m aterials |a Materials |v Congresse |x Reliability |
| 700 | 1 | # | |u eda, Osamu |a Ueda, Osamu |
| 830 | # | 1 | |m aterials Research Society symposia proceedings |a Materials Research Society symposia proceedings |v v. 143 |
| 856 | 4 | 0 | |z Click Here to View Status and Holdings. |u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=521257 |
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Materials reliability in microelectronics II proceedings of the ... held April 27-May 1, 1992