Reliability and materials issues of III-V and II-VI semiconductor optical and electrical devices and materials II symposium held April 9-13, 2012, San Francisco, California, USA

Reliability and materials issues of III-V and II-VI semiconductor optical and electrical devices and materials II symposium held April 9-13, 2012, San Francisco, California, USA

Saved in:
Bibliographic Details
Corporate Author: Symposium G, "Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials II" San Francisco, Calif.
Other Authors: Ueda, Osamu
Format: Book
Published: rrendale, Pa Materials Research Society 2012
Series:Materials Research Society symposia proceedings v. 143
Subjects:
icroelectronics > Microelectronics > Congresse > Reliability
emiconductors > Semiconductors > Congresse > Materials
aterials > Materials > Congresse > Reliability
Online Access:Click Here to View Status and Holdings.
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Physical Description:xiii, 195 p. ill. 24 cm
Bibliography:Includes bibliographical references and indexes
ISBN:9781605114095 (hbk.)
160511409X (hbk.)

Similar Items