Defect recognition and image processing in III-V compounds proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985

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Bibliographic Details
Other Authors:	Fillard, J. P
Format:	Book
Published:	Amsterdam New York Elsevier 1985
Series:	Materials science monographs 31
Subjects:	Image processing > Congresses > Defects > Congresses Semiconductors > Defects > Congresses Gallium arsenide semiconductors > Congresses > Congresses
Online Access:	Click Here to View Status and Holdings.
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245	1	0	\|a Defect recognition and image processing in III-V compounds \|b proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985 \|c edited by J.P. Fillard
260	#	#	\|a Amsterdam \|a New York \|b Elsevier \|c 1985
300	#	#	\|a xii, 306 p. \|b ill. \|c 25 cm
490	1	#	\|a Materials science monographs \|v 31
504	#	#	\|a Includes bibliographies and index.
650	#	0	\|a Image processing \|v Congresses \|x Defects \|x Congresses
650	#	0	\|a Semiconductors \|x Defects \|x Congresses
650	#	0	\|a Gallium arsenide semiconductors \|v Congresses \|x Congresses
700	1	#	\|a Fillard, J. P
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=49005
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