Defect recognition and image processing in III-V compounds proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985

Defect recognition and image processing in III-V compounds proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985

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Bibliographic Details
Other Authors: Fillard, J. P
Format: Book
Published: Amsterdam New York Elsevier 1985
Series:Materials science monographs 31
Subjects:
Image processing > Congresses > Defects > Congresses
Semiconductors > Defects > Congresses
Gallium arsenide semiconductors > Congresses > Congresses
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:xii, 306 p. ill. 25 cm
Bibliography:Includes bibliographies and index.
ISBN:0444425586

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