Metal-dielectric interfaces in gigascale electronics thermal and electrical stability

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Bibliographic Details
Main Author:	He, Ming
Other Authors:	Lu, T. M. 1943- Toh-Ming
Format:	Unknown
Published:	New York Springer 2012
Series:	Springer series in materials science v. 157
Subjects:	Microelectronics > Materials Interfaces (Physical sciences) > Materials
Online Access:	Click Here to View Status and Holdings.
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020	#	#	\|a 9781461418115 (hbk. : alk. paper)
020	#	#	\|a 1461418119 (hbk. : alk. paper)
040	#	#	\|a CAI \|d ITMB
090	0	0	\|a TK7874 \|b .H3945 2012
100	1	#	\|a He, Ming
245	1	0	\|a Metal-dielectric interfaces in gigascale electronics \|b thermal and electrical stability \|c Ming He, Toh-Ming Lu
260	#	#	\|a New York \|b Springer \|c 2012
300	#	#	\|a xi, 149 p. \|b ill. (some col.) \|c 24 cm
490	1	#	\|a Springer series in materials science \|v v. 157 \|x 0933-033X
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Microelectronics \|x Materials
650	#	0	\|a Interfaces (Physical sciences) \|x Materials
700	1	#	\|a Lu, T. M. \|d 1943- \|q Toh-Ming
830	0	#	\|a Springer series in materials science \|v v. 157
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=473906
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