Interfacial compatibility in microelectronics moving away from the trial and error approach
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| Other Authors: | |
|---|---|
| Format: | Book |
| Published: |
New York
Springer
2012
|
| Series: | Microsystems Series
|
| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
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| LEADER | 00000n a2200000 a 4501 | ||
|---|---|---|---|
| 001 | wils-473843 | ||
| 020 | # | # | |a 9781447124696 (hbk.) |
| 020 | # | # | |a 1447124693 (hbk.) |
| 040 | # | # | |a GW5XE |d ITMB |
| 090 | 0 | 0 | |a TK7874 |b .I55 2012 |
| 245 | 0 | 0 | |a Interfacial compatibility in microelectronics |b moving away from the trial and error approach |c Tomi Laurila ... [et al.] |
| 260 | # | # | |a New York |b Springer |c 2012 |
| 300 | # | # | |a x, 217 p. |b ill. (some col.) |c 25 cm |
| 490 | 1 | # | |a Microsystems |x 1389-2134 |
| 504 | # | # | |a Includes bibliographical references and index |
| 650 | # | 0 | |a Microelectronics |
| 700 | 1 | # | |a Laurila, Tomi |
| 830 | 0 | # | |a Microsystems Series |
| 856 | 4 | 0 | |z Click Here to View Status and Holdings. |u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=473843 |
| 964 | # | # | |c BOK |d EE |
Microelectronics