SAR image analysis, modeling, and techniques X 21-23 September 2010, Toulouse, France
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| Corporate Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Book |
| Published: |
Bellingham, Wash.
SPIE
2010
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering
v. 7829 0277-786X |
| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
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Synthetic aperture radar polarimetry
