SAR image analysis, modeling, and techniques X 21-23 September 2010, Toulouse, France

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Bibliographic Details
Corporate Authors:	European Association of Remote Sensing Companies, SPIE (Society)
Other Authors:	Notarnicola, Claudia
Format:	Book
Published:	Bellingham, Wash. SPIE 2010
Series:	Proceedings of SPIE--the International Society for Optical Engineering v. 7829 0277-786X
Subjects:	Remote sensing > Congresses Synthetic aperture radar > Congresses > Image quality Infrared imaging > Congresses Interferometry > Congresses
Online Access:	Click Here to View Status and Holdings.
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