SAR image analysis, modeling, and techniques X 21-23 September 2010, Toulouse, France

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Bibliographic Details
Corporate Authors:	European Association of Remote Sensing Companies, SPIE (Society)
Other Authors:	Notarnicola, Claudia
Format:	Book
Published:	Bellingham, Wash. SPIE 2010
Series:	Proceedings of SPIE--the International Society for Optical Engineering v. 7829 0277-786X
Subjects:	Remote sensing > Congresses Synthetic aperture radar > Congresses > Image quality Infrared imaging > Congresses Interferometry > Congresses
Online Access:	Click Here to View Status and Holdings.
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MARC


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245	0	0	\|a SAR image analysis, modeling, and techniques X \|b 21-23 September 2010, Toulouse, France \|c Claudia Notarnicola, editors ; sponsored by SPIE ; cooperating organisations, European Association of Remote Sensing Companies (Belgium) ... [et al.]
246	1	#	\|a Synthetic aperture radar image analysis, modeling, and techniques X
260	#	#	\|a Bellingham, Wash. \|b SPIE \|c 2010
300	#	#	\|a 1 v. (various pagings) \|b ill. \|c 28 cm
490	1	#	\|a Proceedings of SPIE \|v v. 7829 \|x 0277-786X
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Remote sensing \|v Congresses
650	#	0	\|a Synthetic aperture radar \|v Congresses \|x Image quality
650	#	0	\|a Synthetic aperture radar \|v Congresses \|x Image quality
650	#	0	\|a Infrared imaging \|v Congresses
650	#	0	\|a Interferometry \|v Congresses
700	1	#	\|a Notarnicola, Claudia
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710	#	#	\|a SPIE (Society)
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