SAR image analysis, modeling, and techniques X 21-23 September 2010, Toulouse, France

SAR image analysis, modeling, and techniques X 21-23 September 2010, Toulouse, France

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Bibliographic Details
Corporate Authors: European Association of Remote Sensing Companies, SPIE (Society)
Other Authors: Notarnicola, Claudia
Format: Book
Published: Bellingham, Wash. SPIE 2010
Series:Proceedings of SPIE--the International Society for Optical Engineering v. 7829 0277-786X
Subjects:
Remote sensing > Congresses
Synthetic aperture radar > Congresses > Image quality
Infrared imaging > Congresses
Interferometry > Congresses
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:1 v. (various pagings) ill. 28 cm
Bibliography:Includes bibliographical references and index
ISBN:9780819483461 (pbk.)
081948346X (pbk.)
ISSN:0277-786X

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