Precision landmark location for machine vision and photogrammetry finding and achieving the maximum possible accuracy

Precision landmark location for machine vision and photogrammetry finding and achieving the maximum possible accuracy

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Bibliographic Details
Main Author: Gutierrez, Jose A.
Other Authors: Armstrong, Brian Stewart Randall
Format: Unknown
Published: London Springer 2010
Subjects:
Computer vision > Digital techniques
Photogrammetry > Digital techniques
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:xi, 162 p. ill. (some col.) 24 cm
Bibliography:Includes bibliographical references (p. [155]-157) and index
ISBN:1849966745 (pbk.)
9781849966740 (pbk.)

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