Reliability and radiation effects in compound semiconductors

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Bibliographic Details
Main Author: Johnston, Alla Allan H.
Format: Unknown
Published: Hackensack, NJ World Scientific 2010
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Online Access:Click Here to View Status and Holdings.
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LEADER 00000n a2200000 a 4501
001 wils-446704
020 # # |a 981427710X 
020 # # |a 9789814277105 
040 # # |a BTCTA  |d ITMB 
090 0 0 |a TK7871.99.C65  |b J64 2010 
100 1 # |a Johnston, Alla  |q Allan H. 
245 1 0 |a Reliability and radiation effects in compound semiconductors  |c Allan Johnston 
260 # # |a Hackensack, NJ  |b World Scientific  |c 2010 
300 # # |a xii, 363 p.  |b ill.  |c 24 cm 
504 # # |a Includes bibliographical references and index 
650 # 0 |a Compound semiconductors  |x Reliability 
650 # 0 |a Compound semiconductors  |x Effect of radiation on 
856 4 0 |z Click Here to View Status and Holdings.  |u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=446704 
964 # # |c BOK  |d EM 
998 # # |a 00260##a002.8.2||00260##b002.8.4||00260##c002.7.6||00300##a003.4.1||00300##b003.6.1||00300##c003.5.1||