Reliability and radiation effects in compound semiconductors

Reliability and radiation effects in compound semiconductors

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Bibliographic Details
Main Author: Johnston, Alla Allan H.
Format: Unknown
Published: Hackensack, NJ World Scientific 2010
Subjects:
Compound semiconductors > Reliability
Compound semiconductors > Effect of radiation on
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:xii, 363 p. ill. 24 cm
Bibliography:Includes bibliographical references and index
ISBN:981427710X
9789814277105

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