Precision landmark location for machine vision and photogrammetry finding and achieving the maximum possible accuracy

Saved in:
Bibliographic Details
Main Author: Gutierrez, Jose A. PhD
Other Authors: Armstrong, Brian Stewart Randall
Format: Unknown
Published: London Springer 2008
Subjects:
Online Access:Click Here to View Status and Holdings.
Tags: Add Tag
No Tags, Be the first to tag this record!

MARC

LEADER 00000n a2200000 a 4501
001 wils-437972
020 # # |a 9781846289125 
020 # # |a 1846289122 
040 # # |a UKM  |d ITMB 
090 0 0 |a TA1634  |b .G88 2008 
100 1 # |a Gutierrez, Jose A.  |c PhD 
245 1 0 |a Precision landmark location for machine vision and photogrammetry  |b finding and achieving the maximum possible accuracy  |c Jose A. Gutierrez, Brian S.R. Armstrong 
260 # # |a London  |b Springer  |c 2008 
300 # # |a xi, 162 p.  |b ill. (some col.)  |c 24 cm 
504 # # |a Includes bibliographical references and index 
650 # 0 |a Photogrammetry  |x Digital techniques 
650 # 0 |a Computer vision 
700 1 # |a Armstrong, Brian Stewart Randall 
856 4 0 |z Click Here to View Status and Holdings.  |u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=437972 
964 # # |c BOK  |d AD 
998 # # |a 00260##a002.8.2||00260##b002.8.4||00260##c002.7.6||00300##a003.4.1||00300##b003.6.1||00300##c003.5.1||