Precision landmark location for machine vision and photogrammetry finding and achieving the maximum possible accuracy

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Bibliographic Details
Main Author: Gutierrez, Jose A. PhD
Other Authors: Armstrong, Brian Stewart Randall
Format: Unknown
Published: London Springer 2008
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Description
Physical Description:xi, 162 p. ill. (some col.) 24 cm
Bibliography:Includes bibliographical references and index
ISBN:9781846289125
1846289122