Quality aspects in spatial data mining

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Bibliographic Details
Other Authors: Stein, Alfred, Bijker, Wietske 1965-, Shi, Wenzhong
Format: Book
Published: Boca Raton, FL CRC Press 2009
Subjects:
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Description
Physical Description:xx, 364 p. ill., maps 25 cm
Bibliography:Includes bibliographical references and index
ISBN:9781420069266 (alk. paper)
1420069268 (alk. paper)