Defects in Microelectronic Materials and Devices

Defects in Microelectronic Materials and Devices

Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes requi...

Full description

Saved in:
Bibliographic Details
Other Authors: Fleetwood, Daniel M. (Editor), Pantelides, Sokrates T. (Editor), Schrimpf, Ronald Donald (Editor)
Format: Book
Language:English
Published: Boca Raton CRC Press 2009
Subjects:
Microelectronics > Testing > Materials
Metal oxide semiconductor field-effect transistors > Testing
Integrated circuits > Defects > Testing
Online Access:Click Here to View Status and Holdings.
Tags: Add Tag
No Tags, Be the first to tag this record!
Be the first to leave a comment!
You must be logged in first

Similar Items