Nanometer technology designs high-quality delay tests

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Bibliographic Details
Main Author:	Tehranipoor, Mohammad H. 1974-
Other Authors:	Ahmed, Nisar
Format:	Unknown
Published:	New York Springer 2008
Edition:	1st ed
Subjects:	Integrated circuits > Testing Integrated circuits > Very large scale integration Nanotechnology
Online Access:	Click Here to View Status and Holdings.
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020	#	#	\|a 9780387764863 (hardcover : alk. paper)
020	#	#	\|a 0387764860 (hardcover : alk. paper)
040	#	#	\|a BTCTA \|d ITMB
090	0	0	\|a TK7874 \|b .T44 2008
100	1	#	\|a Tehranipoor, Mohammad H. \|d 1974-
245	1	0	\|a Nanometer technology designs \|b high-quality delay tests \|c Mohammad Tehranipoor, Nisar Ahmed
250	#	#	\|a 1st ed
260	#	#	\|a New York \|b Springer \|c 2008
300	#	#	\|a xvii, 281 p. \|b ill. \|c 25 cm
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Integrated circuits \|x Testing
650	#	0	\|a Integrated circuits \|x Very large scale integration
650	#	0	\|a Nanotechnology
700	1	#	\|a Ahmed, Nisar
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=396906
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