Nanometer technology designs high-quality delay tests

Nanometer technology designs high-quality delay tests

Saved in:
Bibliographic Details
Main Author: Tehranipoor, Mohammad H. 1974-
Other Authors: Ahmed, Nisar
Format: Unknown
Published: New York Springer 2008
Edition:1st ed
Subjects:
Integrated circuits > Testing
Integrated circuits > Very large scale integration
Nanotechnology
Online Access:Click Here to View Status and Holdings.
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Physical Description:xvii, 281 p. ill. 25 cm
Bibliography:Includes bibliographical references and index
ISBN:9780387764863 (hardcover : alk. paper)
0387764860 (hardcover : alk. paper)

Similar Items