Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies of...
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Other Authors: | |
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Format: | Book |
Language: | English |
Published: |
New York
Springer
2008
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Series: | Frontiers in electronic testing
v.37 |
Subjects: | |
Online Access: | Click Here to View Status and Holdings. |
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245 | 0 | 0 | |a Emerging Nanotechnologies |b Test, Defect Tolerance, and Reliability |c edited by Mohammad Tehranipoor |
264 | # | 1 | |a New York |b Springer |c 2008 |
264 | # | 4 | |c ©2008 |
300 | # | # | |a xii, 405 pages |b illustrations |c 24 cm |
336 | # | # | |a text |2 rdacontent |
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490 | 1 | # | |a Frontiers in electronic testing |v v.37 |
504 | # | # | |a Includes bibliographical references and index |
520 | # | # | |a Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. |
650 | # | 0 | |a Microtechnology |
650 | # | 0 | |a Nanotechnology |
700 | 1 | # | |a Tehranipoor, Mohammad |e editor |
856 | 4 | 0 | |z Click Here to View Status and Holdings. |u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=385036 |
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