Emerging Nanotechnologies Test, Defect Tolerance, and Reliability

• Other Authors: Tehranipoor, Mohammad (Editor)
• Format: Book
• Language: English
• Published: New York Springer 2008
• Series: Frontiers in electronic testing v.37
• Subjects: Microtechnology; Nanotechnology
• Online Access: Click Here to View Status and Holdings.
• Physical Description: xii, 405 pages illustrations 24 cm
• Bibliography: Includes bibliographical references and index
• ISBN: 9780387747460; 038774746X

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.