Stochastic ageing and dependence for reliability

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Bibliographic Details
Main Author: Lai, Chin-Diew
Other Authors: Xie, Min
Format: Book
Published: New York, NY Springer Science + Business Media 2006
Subjects:
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Description
Physical Description:xx, 418 p. ill. 24 cm
Bibliography:Includes bibliographical references (p. [363]-408) and index
ISBN:0387297421
9780387297422