Defect-oriented testing for nano-metric CMOS VLSI circuit

Defect-oriented testing for nano-metric CMOS VLSI circuit

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Bibliographic Details
Main Author: Sachdev, Manoj
Other Authors: Pineda de Gyvez, Jose
Format: Book
Published: Dordrecht Springer 2007
Edition:2nd ed.
Series:Frontiers in electronic testing 34
Subjects:
Metal oxide semiconductors, Complementary > Testing
Metal oxide semiconductors, Complementary > Defects > Defects
Integrated circuits > Very large scale integration > Testing
Integrated circuits > Very large scale integration > Defects
Online Access:Click Here to View Status and Holdings.
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Description
Item Description:New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998
Physical Description:xxi, 328 p. ill. 24 cm
Format:Mode of access: World Wide Web
ISBN:9780387465463 (hd.bd.)
0387465464 (hd.bd.)

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