Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces

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Bibliographic Details
Main Author:	Kaupp, G. Gerd
Format:	Book
Published:	Berlin Springer-Verlag 2006
Series:	Nanoscience and technology
Subjects:	Near-field microscopy Atomic force microscopy
Online Access:	Click Here to View Status and Holdings.
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LEADER	00000n a2200000 a 4501
001	wils-373529
020	#	#	\|a 3540284052 (hd.bd.)
020	#	#	\|a 9783540284055 (hd.bd.)
040	#	#	\|a OHX \|d ITMB
090	0	0	\|a QH212.A78 \|b K38 2006
100	1	#	\|a Kaupp, G. \|q Gerd
245	1	0	\|a Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching \|b application to rough and natural surfaces \|c G. Kaupp
260	#	#	\|a Berlin \|b Springer-Verlag \|c 2006
300	#	#	\|a xii, 292 p. \|b ill. \|c 24 cm
490	1	#	\|a Nanoscience and technology \|x 1434-4904
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Near-field microscopy
650	#	0	\|a Atomic force microscopy
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=373529
964	#	#	\|c BOK \|d 01