Electron microscopy and analysis

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Bibliographic Details
Main Author:	Goodhew, Peter J.
Other Authors:	Humphreys, F. J., Beanland, R.
Format:	Unknown
Published:	New York Taylor & Francis 2001
Edition:	3rd ed
Subjects:	Electron microscopy
Online Access:	Click Here to View Status and Holdings.
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MARC


LEADER	00000n a2200000 a 4501
001	wils-373465
020	#	#	\|a 0748409688 (pbk.)
020	#	#	\|a 9780748409686
040	#	#	\|a DLC \|d ITMB
090	0	0	\|a QH212.E4 \|b G62 2001
100	1	#	\|a Goodhew, Peter J.
245	1	0	\|a Electron microscopy and analysis \|c Peter J. Goodhew, John Humphreys, Richard Beanland
250	#	#	\|a 3rd ed
260	#	#	\|a New York \|b Taylor & Francis \|c 2001
300	#	#	\|a x, 251 p. \|b ill. \|c 24 cm
504	#	#	\|a Includes bibliographical references (p. 236-237) and index
650	#	0	\|a Electron microscopy
700	1	#	\|a Humphreys, F. J.
700	#	#	\|a Beanland, R.
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=373465
964	#	#	\|c BOK \|d 01
998	#	#	\|a 00250##a0011.2.2\|\|00260##a0011.2.2\|\|00260##b0011.2.2\|\|00260##c0011.2.2\|\|00300##a0011.2.2\|\|00300##b0011.2.2\|\|00300##c0011.2.2\|\|01700##a0011.2.2\|\|