Electron microscopy and analysis

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Bibliographic Details
Main Author: Goodhew, Peter J.
Other Authors: Humphreys, F. J., Beanland, R.
Format: Book
Published: New York Taylor & Francis 2001
Edition:3rd ed
Subjects:
Online Access:Click Here to View Status and Holdings.
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245 1 0 |a Electron microscopy and analysis  |c Peter J. Goodhew, John Humphreys, Richard Beanland 
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260 # # |a New York  |b Taylor & Francis  |c 2001 
300 # # |a x, 251 p.  |b ill.  |c 24 cm 
504 # # |a Includes bibliographical references (p. 236-237) and index 
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700 # # |a Beanland, R. 
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