Electron microscopy and analysis
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Main Author: | |
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Other Authors: | , |
Format: | Book |
Published: |
New York
Taylor & Francis
2001
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Edition: | 3rd ed |
Subjects: | |
Online Access: | Click Here to View Status and Holdings. |
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001 | wils-373465 | ||
020 | # | # | |a 0748409688 (pbk.) |
020 | # | # | |a 9780748409686 |
040 | # | # | |a DLC |d ITMB |
090 | 0 | 0 | |a QH212.E4 |b G62 2001 |
100 | 1 | # | |a Goodhew, Peter J. |
245 | 1 | 0 | |a Electron microscopy and analysis |c Peter J. Goodhew, John Humphreys, Richard Beanland |
250 | # | # | |a 3rd ed |
260 | # | # | |a New York |b Taylor & Francis |c 2001 |
300 | # | # | |a x, 251 p. |b ill. |c 24 cm |
504 | # | # | |a Includes bibliographical references (p. 236-237) and index |
650 | # | 0 | |a Electron microscopy |
700 | 1 | # | |a Humphreys, F. J. |
700 | # | # | |a Beanland, R. |
856 | 4 | 0 | |z Click Here to View Status and Holdings. |u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=373465 |
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