Electron microscopy and analysis

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Bibliographic Details
Main Author: Goodhew, Peter J.
Other Authors: Humphreys, F. J., Beanland, R.
Format: Book
Published: New York Taylor & Francis 2001
Edition:3rd ed
Subjects:
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:x, 251 p. ill. 24 cm
Bibliography:Includes bibliographical references (p. 236-237) and index
ISBN:0748409688 (pbk.)
9780748409686