Scanning probe microscopy electrical and electromechanical phenomena at the nanoscale
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Format: | Book |
Published: |
New York
Springer
2007
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Online Access: | Click Here to View Status and Holdings. |
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001 | wils-366689 | ||
020 | 0 | 0 | |a 9780387286679 (2-v. set : hd.bd.) |
020 | 0 | 0 | |a 0387286675 (2-v. set : hd.bd.) |
040 | # | # | |a OHX |d ITMB |
090 | 0 | 0 | |a QH212.S33 |b S395 2007 |
245 | 0 | 0 | |a Scanning probe microscopy |b electrical and electromechanical phenomena at the nanoscale |c Sergei V. Kalinin, Alexei Gruverman, editors |
260 | 0 | 0 | |a New York |b Springer |c 2007 |
300 | 0 | 0 | |a 2 v. (xx, 980 p.) |b ill. (some col.) |c 25 cm |
504 | 0 | 0 | |a Includes bibliographical references and index |
650 | # | 0 | |a Scanning probe microscopy |
650 | # | 0 | |a Nanoelectronics |
700 | 1 | 1 | |a Kalinin, S. V. |q Sergei Vasilevich |
700 | 1 | 1 | |a Gruverman, A. |q Alexei |
856 | 4 | 0 | |z Click Here to View Status and Holdings. |u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=366689 |
964 | # | # | |c BOK |d 01 |