Essential issues in SOC design designing complex systems-on-chip

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Bibliographic Details
Corporate Author: Design, Automation, and Test in Europe Conference and Exhibition
Other Authors: Lin, Youn-Long Steve
Format: Conference Proceeding
Published: Dordrecht Springer 2006
Subjects:
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Description
Item Description:Papers presented at a workshop held at the 2005 DATE Conference held in Munich
Physical Description:vii, 403 p. ill. 25 cm
Bibliography:Includes bibliographical references
ISBN:9781402053511 (hbk.)
1402053517 (hbk.)
9781402053528 (e-book)
1402053525 (e-book)