Semiconductor material and device characterization

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Bibliographic Details
Main Author:	Schroder, Dieter K.
Format:	Book
Published:	Piscataway, NJ; Hoboken, NJ John Wiley & Sons, Inc. 2006
Edition:	3rd ed
Subjects:	Semiconductors Semiconductors > Testing
Online Access:	Click Here to View Status and Holdings.
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020	0	0	\|a 0471739065 (acid-free paper)
020	0	0	\|a 9780471739067
040	#	#	\|a DLC \|d ITMB
090	0	0	\|a QC611 \|b .S335 2006
100	1	0	\|a Schroder, Dieter K.
245	1	0	\|a Semiconductor material and device characterization \|c Dieter K. Schroder
250	0	0	\|a 3rd ed
260	0	0	\|a Piscataway, NJ; \|a Hoboken, NJ \|b John Wiley & Sons, Inc. \|c 2006
300	0	0	\|a xv, 779 p. \|b ill. \|c 25 cm
500	0	0	\|a "Wiley-Interscience"
504	0	0	\|a Includes bibliographical references and index
650	#	0	\|a Semiconductors
650	#	0	\|a Semiconductors \|x Testing
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=361156
964	#	#	\|c BOK \|d 01