Semiconductor material and device characterization

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Bibliographic Details
Main Author: Schroder, Dieter K.
Format: Book
Published: Piscataway, NJ; Hoboken, NJ John Wiley & Sons, Inc. 2006
Edition:3rd ed
Subjects:
Online Access:Click Here to View Status and Holdings.
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Description
Item Description:"Wiley-Interscience"
Physical Description:xv, 779 p. ill. 25 cm
Bibliography:Includes bibliographical references and index
ISBN:0471739065 (acid-free paper)
9780471739067