Semiconductor material and device characterization
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Main Author: | |
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Format: | Book |
Published: |
Piscataway, NJ; Hoboken, NJ
John Wiley & Sons, Inc.
2006
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Edition: | 3rd ed |
Subjects: | |
Online Access: | Click Here to View Status and Holdings. |
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Item Description: | "Wiley-Interscience" |
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Physical Description: | xv, 779 p. ill. 25 cm |
Bibliography: | Includes bibliographical references and index |
ISBN: | 0471739065 (acid-free paper) 9780471739067 |