Scanning electron microscopy physics of image formation and microanalysis

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Bibliographic Details
Main Author:	Reimer, Ludwig 1928-
Format:	Unknown
Published:	Berlin; New York Springer 1998
Edition:	2nd ed
Series:	Springer series in optical sciences v. 45
Subjects:	Scanning electron microscopy
Online Access:	Click Here to View Status and Holdings.
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020	#	#	\|a 3540639764
020	#	#	\|a 9783540639763
040	#	#	\|a DLC \|d ITMB
090	0	0	\|a QH212.S3 \|b R452 1998
100	1	#	\|a Reimer, Ludwig \|d 1928-
245	1	0	\|a Scanning electron microscopy \|b physics of image formation and microanalysis \|c Ludwig Reimer
250	#	#	\|a 2nd ed
260	#	#	\|a Berlin; \|a New York \|b Springer \|c 1998
300	#	#	\|a xiv, 527 p. \|b ill. \|c 24 cm
490	1	#	\|a Springer series in optical sciences \|v v. 45
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Scanning electron microscopy
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=357847
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