Scanning electron microscopy physics of image formation and microanalysis

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Bibliographic Details
Main Author: Reimer, Ludwig 1928-
Format: Book
Published: Berlin; New York Springer 1998
Edition:2nd ed
Series:Springer series in optical sciences v. 45
Subjects:
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Description
Physical Description:xiv, 527 p. ill. 24 cm
Bibliography:Includes bibliographical references and index
ISBN:3540639764
9783540639763