Data mining and diagnosing IC fails
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| Main Author: | |
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| Format: | Unknown |
| Published: |
New York
Springer
2005
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| Series: | Frontiers in electronic testing
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| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
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Principles of semiconductor network testing
Electronic Design Automation for IC System Design, Verification, and Testing
DIGITAL TECHNOLOGY with MOS Integrated Circuits
