Data mining and diagnosing IC fails

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Bibliographic Details
Main Author:	Huisman, Leendert M
Format:	Unknown
Published:	New York Springer 2005
Series:	Frontiers in electronic testing
Subjects:	Semiconductors > Failures Data mining Integrated circuits > Testing > Statistical methods
Online Access:	Click Here to View Status and Holdings.
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MARC


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100	1	#	\|a Huisman, Leendert M
245	1	1	\|a Data mining and diagnosing IC fails \|c Leendert M. Huisman
260	#	#	\|a New York \|b Springer \|c 2005
300	#	#	\|a 270 p. \|b ill. \|c 24 cm
490	1	#	\|a Frontiers in electronic testing
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Semiconductors \|x Failures
650	#	0	\|a Data mining
650	#	0	\|a Integrated circuits \|x Testing \|x Statistical methods
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=348979
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