Data mining and diagnosing IC fails

Data mining and diagnosing IC fails

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Bibliographic Details
Main Author: Huisman, Leendert M
Format: Book
Published: New York Springer 2005
Series:Frontiers in electronic testing
Subjects:
Semiconductors > Failures
Data mining
Integrated circuits > Testing > Statistical methods
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:270 p. ill. 24 cm
Bibliography:Includes bibliographical references and index
ISBN:0387249931 (alk. paper)
9780387249933
9780387263519
0387263519 (e-book)

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